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ES:Ji Hong

published: 2016-12-27 14:17:05       hits: 

name : Ji  Hong  Sex: Male phone: +86-13350076213
email: office-address: Institute Building 324A ,No. 2006, Xi Yuan Avenue, West High-tech Zone, Chengdu, Sichuan, 611731, P.R. China
PH.D  Supervisor: No Master Supervisor: Yes
major: Electronic Science and Technology
research interest: Electronic Information Material and Devices, X-ray Characterization  Technology in  Functional Electronic Thin Films
Biography: Ji Hong was born in Chengdu in 1960. He attended Chengdu University of Technology (CDUT)in 1977, and received his bachelor degree in geology science in1982. Since then, he took a scientific research and teaching post there. During his 11 years in CDUT, he gained many analysis experiences,such as scanning electron microscopy (SEM) and X-ray diffraction (XRD), etc. He left CDUT in 1993, and then shifted his work to University of Electronic Science and Technology of China (UESTC). He published over 40 papers on academic journals and conferences and made his important contribution to development of State Key Laboratory of Electronic Thin Films and Integrated Devices (SKLETFID)in 2003-2007, including establishing the high resolution X-ray diffraction(HRXRD) laboratory, based in SKLETFID. He was granted the title of “Excellent Technical Manager for Scientific Instrument” by UESTC in 1998 and awarded a second place of “National Defensive Science & Technology Progress Award” in 2003. In December 2006, he came Hong Kong Polytechnic University as a technical support staff. Now he serves as an experienced senior engineer in UESTC. As a director of Chinese CrystallographicSociety (CCrS). he focuses the attention on X-ray characterization in  functional electronic thin films..
Education experience: Ji Hong attended Chengdu University of Technology (CDUT)in 1977, and received his bachelor degree in geology science in1982. 
Selected Publications:
[1] α-Al2O3 Relative Humidity Sensor, The 4th International Symposiun on Humidity and Moisture (ISHM 2002 Taiwan), H.Ji  M.C. Jin  Q.Shi
[2] Pole Figure Studies of LaNiO3 Film Prepared on Vicinal MgO(100) Substrate by Pulsed Laser Deposition, 18th International Symposium on Integrated Ferroelectrics , Honolulu, Hawaii, USA, 2006.4, H.Ji  C.M. Zuo  Y.R. Li  W.J.Leng  S.B.Lu  C.M.Zou
[3] Interface characterization of SrTiO3/Sr/Si heterostructure through X-ray reflectivity, Journal of Physics: Conference Series 152 (2009) 012001,H.Ji  X.Y.Zhou  W.Wang  Y.R. Li  Y.Wang
[4] Electronspun Cu2ZnSnS4 microfibers with strong (112) preferred orientation: fabrication and characterization, RSC Advances  2015,5, 1574 C.H.Mu, Y.Q.Song, H.Ji
[5] X-ray diffraction analyses of RF sputtered Ba0.6Sr0.4TiO3 thin films grown on Pt/Ti/LaALO3(100) substrates,  Journal of Materials Science: Materials in Electronic ISSN 0957-4522 Volume 25 Number 4 H.W.Cheng  H.Ji
[6] MgO/α-Al2O3 单晶衬底上磁控溅射Pt外延薄膜微结构观测分析,科学通报,2016年,第61卷,1~7,张祎杨朱华星姬洪
[7] Si/Si1-xGex/Si半导体薄膜的HRXRD的评价与研究,OPCM ’2006第十三届全国凝聚态物质光学性质学术7议(分组邀请报告),2006,8 中国厦门,姬洪张静冷文建左长明
[8]一种可长期维持低露点测试室的方法及其应用,«测试技术» 增刊(2006),N26,33-35,姬洪金懋昌曹佩韦张池军
[9] WSC-2型微量水份仪的时间常数, «测试技术» 增刊2010,N30, 46-47,
[10] SrTiO3薄膜材料的高分辨X射线衍射分析研究,2005年全国功能材料会议论文集(此文被EI检索),  姬洪何士明左长明